Supply of laboratory equipment for metrology and dimensional characterisation in microelectronics and its applications – 47.1 CNC coordinate measuring machine with non-contact image analysis and contact probing

Summary

The tender concerns the supply of laboratory equipment for metrology and dimensional characterisation in microelectronics and its applications, specifically a CNC coordinate measuring machine with non-contact image analysis and contact probing. The bidder must be registered in its home country, submit the DUAE form, and may later have to provide supporting documents such as a certificate from the commercial register or equivalent foreign documents. The notice also requires electronic invoicing or an electronic process. Exact qualification and compliance details must be checked in the tender documents.