Scanning electron microscope

Summary

The tender concerns the supply of a high-end, user-friendly and versatile scanning electron microscope (SEM) with state-of-the-art energy dispersive X-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must provide excellent high-resolution imaging of dry samples regardless of geometry, surface topography, conductivity or magnetic properties. The notice does not provide precise bidder qualification or exclusion requirements; these must be checked in the tender documents.