Tender detail
Dual Beam Focused Ion Beam System and Transmission Electron Microscope
Summary
The tender concerns the supply of two items: a Dual Beam Focused Ion Beam system (FIB) and a transmission electron microscope (TEM). The bidder must provide delivery, installation, commissioning, handover ready for operation, instruction/training and full system documentation. The exact technical requirements and evaluation aspects are set out in separate documents.
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