Tender detail
Semi-automatic prober for characterization of 200 mm wafers
Summary
The tender concerns a semi-automatic wafer prober system with an integrated characterization system for the electrical characterization of 200 mm wafers. The successful bidder must supply, install and commission the equipment and train the operating staff.
More tender information after sign-in
The public view shows key tender details. Sign in to open official links, documents and AI tender support.